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Solar Cell Characterisation  
 
 

 

 

In this era of renewable energy and space exploration, harnessing the solar energy is becoming increasingly

important. As a result, different material systems are

being employed, new designs implemented and systems

tailored for use in particular situations.

 

The PVE300 permits the determination of device spectral

responsivity (from which may be determined EQE), and,

having performed measurements of sample reflectance (and

transmittance where required) the determination of IQE.

 

A monochromatic probe based such on a Bentham TMc300 single monochromator and typically a Xenon/Quartz

halogen light source, is launched onto the sample under test, giving coverage over the spectral range

350-2500nm.

 

 

Core Features

 

Direct determination of device spectral response (SR, A W-1)

Direct determination of device external quantum efficiency (EQE/IPCE, %)

Chopped, monochromatic probe, 1 -10m m diameter

Light-tight measurement chamber

20x 20c m temperature controlled vacuum mount

Use with substrate, superstrate or packaged devices

Transformer or Amplifier & lock-in based detection

Device operation in short circuit or voltage biased

Choice of single or multiple channel solar simulators

Wide range of operation 300-2500nm

Calibrated reference Si/Ge detectors

 

 

Options

 

Integrating sphere-based determination of reflectance/transmittance to yield internal quantum efficiency (IQE, %)

Motorized x-y stage for device uniformity measurement

Characterization of fluorescent materials with addition of second monochromator

 

 

 

 

 
       
 

 

Asia Qtech Instrument Inc
4F-B, No 327, Sec. 1, Tiding Blvd., Neihu District, Taipei, Taiwan
Tel:+886-2-27966289 Fax:+886-2-27956098